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Michael Orshansky is an American researcher in integrated circuit design, currently with University of Texas at Austin since 2003. He received his undergraduate education and Ph.D. at the UC Berkeley.〔(Orshansky's home page at UTA )〕 His research interests include statistical CAD algorithms for design for manufacturability, robust circuit design in the presence of process variability, low-power circuit design, modeling and characterization of semiconductor devices. He is a recipient of the 2004 National Science Foundation Early Career Development Award (CAREER award),〔("Engineer gets $400,000 from the National Science Foundation to improve reliability of nano-sized microchip behavior" ) 〕 the 2004 IEEE Transactions on Semiconductor Manufacturing Best Paper Award,〔"2004 Best Paper Awards", IEEE Trans. SM, vol. 18, no. 4, 2005. — award for “Characterization of Spatial Intrafield Gate CD Variability, Its Impact on Circuit Performance, and Spatial Mask-Level Correction,” by Michael Orshansky, Linda Milor, and Chenming Hu. 〕 the Best Paper Award at the 2005 Design Automation Conference〔(Orshansky profile at the faculty directory ) 〕 and the annual SIGDA Outstanding New Faculty Award.〔("Assistant prof honored by SIGDA" ) 〕 ==Works== *(With Sani Nassifand Duane Boning) (2007) "Design for Manufacturability and Statistical Design: A Constructive Approach", Springer, ISBN 0-387-30928-4 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Michael Orshansky」の詳細全文を読む スポンサード リンク
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